SINGAPORE /PRNewswire/
-- NIWeek - NI
(Nasdaq: NATI), the provider of platform-based systems that enable
engineers and scientists to solve the world's greatest engineering
challenges, released theWireless Test System (WTS),
a solution that dramatically lowers the cost of high-volume
wireless manufacturing test. Although faced with the rising
complexity of wireless test, companies can confidently reduce test
costs and multiply throughput on the production floor with a system
optimized for measurement speed and parallel test.
"Megatrends, such as the Internet of Things (IoT), will push more
devices to include RF and sensor functionality, which has
traditionally been expensive to test. But test cost shouldn't limit
innovation or the economic viability of a product,"
said Olga
Shapiro, program manager for measurement and instrumentation
at Frost & Sullivan. "To remain profitable in the future,
companies will need to rethink their approach for wireless test and
embrace new paradigms. Because the WTS is built on the
industry-proven PXI platform and backed with the market expertise
of NI, we expect it to have significant impact on the profitability
of the IoT."
The
WTS combines the latest advances in PXI hardware to offer a single
platform for multi-standard, multi- DUT and multi-port testing.
When used with flexible test sequencing software, such as the
TestStand Wireless Test Module, manufacturers can significantly
improve instrument utilization when testing multiple devices in
parallel. The WTS integrates easily into a manufacturing line with
ready-to-run test sequences for devices that use chipsets from
suppliers like Qualcomm and Broadcom as well as integrated DUT and
remote automation control. With these features, customers are
seeing considerable efficiency gains from their RF test equipment
and further reducing their cost of test.
"We
tested multiple wireless technologies ranging from Bluetooth to
WiFi to GPS and cellular all with the same equipment using the NI
Wireless Test System," said Markus
Krauss, HARMAN/Becker Automotive Systems GmbH. "The WTS and
NOFFZ's RF test engineering expertise helped us significantly
reduce test time and the time it took to get our test systems up
and running."
The
WTS is the latest system from NI built on PXI hardware and LabVIEW
and TestStand software (see theSemiconductor Test
System launched in 2014). With support for wireless
standards from LTE Advanced to 802.11ac to Bluetooth Low Energy,
the WTS is designed for manufacturing test of WLAN access points,
cellular handsets, infotainment systems and other multi-standard
devices that include cellular, wireless connectivity and navigation
standards. Software-designed PXI vector signal
transceiver technology inside the WTS delivers superior RF
performance in the manufacturing test environment and a platform
that can scale with the evolving requirements of RF test.
For
more information on the new Wireless Test System,
visit ni.com/wts.
About NI
Since
1976, NI (www.ni.com) has made it possible
for engineers and scientists to solve the world's greatest
engineering challenges with powerful platform-based systems that
accelerate productivity and drive rapid innovation. Customers from
a wide variety of industries - from
healthcare to automotive and from consumer electronics to particle
physics - use
NI's integrated hardware and software platform to improve the world
we live in.
LabVIEW, National Instruments, NI, ni.com and NI TestStand are
trademarks of National Instruments. Other product and company names
listed are trademarks or trade names of their respective
companies.
CONTACT:
Hoi Kwan
Miu
Rice
Communications for National Instruments
+65-3157-5686
[email protected]